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| WI-5000 automatic detector | Case 1:BGA welding ball size detection | Case 2:Connector size detection |
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| LED device detection project | Appearance detection of LED devices | Height and coverage of microchip silver pulp | Welding line arc height and quality |
| Serial number | Industry | Picture | WI measurement | WI 3D measurement |
| 1 | LED | |
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| 2 | Welding | ![]() |
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| 3 | Copper plate | ![]() |
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| 4 | FPC | ![]() |
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| 5 | Wafer | ![]() |
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| 6 | Engraved | ![]() |
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| 7 | Coil | ![]() |
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| 8 | Button | ![]() |
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| 9 | Mobile phone frame | ![]() |
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| 10 | Gumming | ![]() |
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| 11 | Chip packaging | ![]() |
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| Serial number | Industry | Picture | WI measurement | WI 3D measurement |
| 12 | PCB | ![]() |
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| 13 | Hardware components | ![]() |
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| 14 | Buzzer | ![]() |
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| 15 | Camera | ![]() |
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| 16 | Screw hole | ![]() |
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| 17 | Building materials surface | ![]() |
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| 18 | Camera lens | ![]() |
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| 19 | Test paper | ![]() |
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| 20 | Gumming | ![]() |
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| 21 | Wire harness | ![]() |
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| Please contact us for other applications. | ||||

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| 3D visual camera | Dual camera system | DB/WB recognition program | Molding decision program | Testing interface |
Visual inspection project |
Wafer visual inspection |
DB&WB visual inspection |
Post road visual inspection |
Visual inspection of final test |
| Testing station | The quality of the wafer appearance,wafer sawing |
Die bond |
Molding Electroplating, ball planting, cutting, etc. |
Final Testing |
| Detectable content | Wafer size,angle Graphical character Defect detection such as Scratches, Pits Pollution, fragmentation |
DB:Chip size detection, appearance defect detection, missing, position deflection, flatness, silver paste weight, climb WB:Line arc defects collapse, line break, thread break, tail warping, line skew, line arc too high, leakage welding, etc. |
Molding/Trim/Form:Plastic material is not fully filled, frame distortion, dislocation, chromatic aberration, porosity, damage, pin deformation, product direction, etc. Plating electroplating:During the production process, the location of material and the direction of material installation, location and size of plating are detected. |
Marking lettering:Lettering, inscription, direction, depth Testing:Bend, damage, deflection, device surface defects, scratches, holes, stacking, tilt, direction, etc. |
Addr: Building 3, sensing equipment Industrial Park, 503 Nanhu Avenue, Wuxi.
Tel: 0510-82391968
Fax: 0510-85037168
E-mail: James.Wu@jpmechanics.com














